Data Converter

Posted on Edited on In

kick-back

kick-back increases CDAC settling time

add pre-amp (more power)

bootstrap T/H Switch

image-20240825222432796

A. Abo et al., "A 1.5-V, 10-bit, 14.3-MS/s CMOS Pipeline Analog-toDigital Converter," IEEE J. Solid-State Circuits, pp. 599, May 1999

Dessouky and Kaiser, "Input switch configuration suitable for rail-to-rail operation of switched opamp circuits," Electronics Letters, Jan. 1999.

Quantization Noise

image-20240825221754959

Quantization noise is less with higher resolution as the input range is divided into a greater number of smaller ranges

This error can be considered a quantization noise with RMS

Bottom plate sampling

Sample signal at the "grounded" side of the capacitor to achieve signal independent sampling

image-20240825231816582

image-20240825232007848

image-20240825232717342

image-20240825233801855

image-20240825233821389

image-20240825233859540

[https://indico.cern.ch/event/1064521/contributions/4475393/attachments/2355793/4078773/esi_sampling_and_converters2022.pdf]

EE 435 Spring 2024 Analog VLSI Circuit Design - Switched-Capacitor Amplifiers Other Integrated Filters, https://class.ece.iastate.edu/ee435/lectures/EE%20435%20Lect%2044%20Spring%202008.pdf

Hold Mode Feedthrough

image-20240820204720277

image-20240820204959977

P. Schvan et al., "A 24GS/s 6b ADC in 90nm CMOS," 2008 IEEE International Solid-State Circuits Conference - Digest of Technical Papers, San Francisco, CA, USA, 2008, pp. 544-634

B. Sedighi, A. T. Huynh and E. Skafidas, "A CMOS track-and-hold circuit with beyond 30 GHz input bandwidth," 2012 19th IEEE International Conference on Electronics, Circuits, and Systems (ICECS 2012), Seville, Spain, 2012, pp. 113-116

Tania Khanna, ESE 568: Mixed Signal Circuit Design and Modeling [https://www.seas.upenn.edu/~ese5680/fall2019/handouts/lec11.pdf]

CDAC intuition

The charge redistribution capacitor network is used to sample the input signal and serves as a digital-to-analog converter (DAC) for creating and subtracting reference voltages

sampling charge \[ Q = V_{in} C_{tot} \] conversion charge \[ Q = -C_{tot}V_c + V_{ref}C_\Delta \] That is \[ V_c = \frac{C_\Delta}{C_{tot}}V_{ref} - V_{in} \]

CDAC is actually working as a capacitive divider during conversion phase, the charge of internal node retain (charge conservation law)

assuming \(\Delta V_i\) is applied to series capacitor \(C_1\) and \(C_2\)

cap_divider.drawio \[ (\Delta V_i - \Delta V_x) C_1 = \Delta V_x \cdot C_2 \] Then \[ \Delta V_x = \frac{C_1}{C_1+C_2}\Delta V_i \]

\(V_x= V_{x,0} + \Delta V_x\)

CDAC settling time

cdac-tau.drawio \[\begin{align} V_x(s) &= \frac{C_1+C_2}{RC_1C_2}\cdot \frac{1}{s+\frac{C_1+C_2}{RC_1C_2}}\cdot V_i(s) \\ &= \frac{1}{\tau}\cdot \frac{1}{s+\frac{1}{\tau}}\cdot \frac{1}{s}\\ &= \frac{1}{\tau}\cdot \tau(\frac{1}{s} - \frac{1}{s+\frac{1}{\tau}})=\frac{1}{s} - \frac{1}{s+\frac{1}{\tau}} \end{align}\]

inverse Laplace Transform is \(V_x(t) = 1 - e^{-t/\tau}\)

\[\begin{align} V_y(s) &= V_x\frac{C_1}{C_1+C_2} \\ &= \frac{C_1}{C_1+C_2} \left(\frac{1}{s} - \frac{1}{s+\frac{1}{\tau}}\right)\\ \end{align}\]

inverse Laplace Transform is \(V_y(t) = \frac{C_1}{C_1+C_2}\left(1 - e^{-t/\tau}\right)\)

\(V_x(t)\) and \(V_y(t)\) prove that the settling time is same

\(\tau = R\frac{C_1C_2}{C_1+C_2}\), which means usually worst for MSB capacitor (largest)

CDAC Energy Consumption

\[ E_{Vref} = \int P(t)dt = \int V_{ref} I(t) dt = V_{ref}\int I(t)dt = V_{ref}\cdot \Delta Q \]

image-20240922093524720

Given \(V_{c,0}=\frac{1}{2}V_{ref}-V_{in}\) and \(V_{c,1}=\frac{3}{4}V_{ref}-V_{in}\) \[\begin{align} Q_{b0,0} &= \left(V_{ref} - V_{c,0} \right)\cdot 2C = \left(\frac{1}{2}V_{ref}+V_{in} \right)\cdot 2C \\ Q_{b1,0} &= (0 - V_{c,0})\cdot C = \left(-\frac{1}{2}V_{ref}+V_{in} \right)\cdot C \\ Q_{b0,1} &= \left(V_{ref} - V_{c,1} \right)\cdot 2C = \left(\frac{1}{4}V_{ref}+V_{in} \right)\cdot 2C \\ Q_{b1,1} &= \left(V_{ref} - V_{c,1} \right)\cdot C = \left(\frac{1}{4}V_{ref}+V_{in} \right)\cdot C \end{align}\]

Therefore \[ E_{Vref} = V_{ref}\cdot (Q_{b0,1}+Q_{b1,1} - Q_{b0,0}-Q_{b1,0}) = \frac{1}{4}C V_{ref}^2 \]

CDAC total energy change \[\begin{align} \Delta E_{tot} &= \frac{1}{2}\cdot 2C \cdot (U_{2c,1}^2 - U_{2c,0}^2) + \frac{1}{2}\cdot C \cdot (U_{c,1}^2 - U_{c,0}^2) + \frac{1}{2}\cdot C \cdot (U_{c1,1}^2 - U_{c1,0}^2) \\ &= \left(-\frac{3}{16}V_{ref}^2 - \frac{1}{2}V_{ref}V_{in} - \frac{3}{32}V_{ref}^2+\frac{3}{4}V_{ref}V_{vin} + \frac{5}{32}V_{ref}^2-\frac{1}{4}V_{ref}V_{in}\right)C \\ &= -\frac{1}{8}CV_{ref}^2 \end{align}\]

alternative method

CapEnergy.drawio \[ \Delta E_{tot} = \frac{1}{2}\cdot\frac{3}{4}C\cdot V_{ref}^2 - \frac{1}{2}\cdot C\cdot V_{ref}^2 = -\frac{1}{8}CV_{ref}^2 \]

The total energy decreases by \(-\frac{1}{8}CV_{ref}^2\), though \(V_{ref}\) provides \(\frac{1}{4}C V_{ref}^2\)

The charge redistribution change the CDAC energy

cap_redis_energy.drawio

\[ E_{c,0} = \frac{1}{2}CV^2 \] After charge redistribution \[ E_{c,1} = \frac{1}{2}\cdot 2C\cdot \left(\frac{1}{2}\right)^2 = \frac{1}{2}CV^2 \]

That make sense, charge redistribution consume energy

Comparator input capacitance

image-20240907194621524 \[ -V_{in}\cdot 2^N C = V_c (2^N C + C_p) \] Then \(V_c = -\frac{2^N C}{2^N C + C_p}V_{in}\), i.e. this capacitance reduce the voltage amplitude by the factor

During conversion \[\begin{align} V_c &= -\frac{2^N C}{2^N C + C_p}V_{in} +V_{ref}\sum_{n=0}^{N-1} \frac{b_n\cdot2^n C}{2^N C + C_p} \\ &= \frac{2^N C}{2^N C + C_p}\left(-V_{in} + V_{ref}\sum_{n=0}^{N-1}\frac{b_n }{2^{N-n}} \right) \end{align}\]

That is, it does not change the sign

SNR of an ADC Due to Clock Jitter

TODO 📅

Chembiyan T, "SNR of an ADC in the presence of clock jitter"[https://www.linkedin.com/posts/chembiyan-t-0b34b910_adcsnrjitter-activity-7171178121021304833-f2Wd?utm_source=share&utm_medium=member_desktop]

K. Tyagi and B. Razavi, "Performance Bounds of ADC-Based Receivers Due to Clock Jitter," in IEEE Transactions on Circuits and Systems II: Express Briefs, vol. 70, no. 5, pp. 1749-1753, May 2023 [https://www.seas.ucla.edu/brweb/papers/Journals/KT_TCAS_2023.pdf]

N. Da Dalt, M. Harteneck, C. Sandner and A. Wiesbauer, "On the jitter requirements of the sampling clock for analog-to-digital converters," in IEEE Transactions on Circuits and Systems I: Fundamental Theory and Applications, vol. 49, no. 9, pp. 1354-1360, Sept. 2002 [https://sci-hub.se/10.1109/TCSI.2002.802353]

reference

everynanocounts. Memos on FFT With Windowing. URL: https://everynanocounts.com/2018/02/01/memos-on-fft-with-windowing/

How to choose FFT depth for ADC performance analysis (SINAD, ENOB). URL:https://dsp.stackexchange.com/a/38201

Computation of Effective Number of Bits, Signal to Noise Ratio, & Signal to Noise & Distortion Ratio Using FFT. URL:https://cdn.teledynelecroy.com/files/appnotes/computation_of_effective_no_bits.pdf

Kester, Walt. (2009). Understand SINAD, ENOB, SNR, THD, THD + N, and SFDR so You Don't Get Lost in the Noise Floor. URL:https://www.analog.com/media/en/training-seminars/tutorials/MT-003.pdf

T. C. Hofner: Dynamic ADC testing part I. Defining and testing dynamic ADC parameters, Microwaves & RF, 2000, vol. 39, no. 11, pp. 75-84,162

T. C. Hofner: Dynamic ADC testing part 2. Measuring and evaluating dynamic line parameters, Microwaves & RF, 2000, vol. 39, no. 13, pp. 78-94

AN9675: A Tutorial in Coherent and Windowed Sampling with A/D Converters https://www.renesas.com/us/en/document/apn/an9675-tutorial-coherent-and-windowed-sampling-ad-converters

APPLICATION NOTE 3190: Coherent Sampling Calculator (CSC) https://www.stg-maximintegrated.com/en/design/technical-documents/app-notes/3/3190.html

Coherent Sampling (Very Brief and Simple) https://www.dsprelated.com/thread/469/coherent-sampling-very-brief-and-simple

Signal Chain Basics #160: Making sense of coherent and noncoherent sampling in data-converter testing https://www.planetanalog.com/signal-chain-basics-160-making-sense-of-coherent-and-noncoherent-sampling-in-data-converter-testing/

Signal Chain Basics #104: Understanding noise in ADCs https://www.planetanalog.com/signal-chain-basics-part-104-understanding-noise-in-adcs/

Signal Chain Basics #101: ENOB Degradation Analysis Over Frequency Due to Jitter https://www.planetanalog.com/signal-chain-basics-part-101-enob-degradation-analysis-over-frequency-due-to-jitter/

Clock jitter analyzed in the time domain, Part 1, Texas Instruments Analog Applications Journal (slyt379), Aug 2010 https://www.ti.com/lit/an/slyt379/slyt379.pdf

Clock jitter analyzed in the time domain, Part 2 https://www.ti.com/lit/slyt389

Measurement of Total Harmonic Distortion and Its Related Parameters using Multi-Instrument [pdf]

Application Note AN-4: Understanding Data Converters' Frequency Domain Specifications [pdf]

Belleman, J. (2008). From analog to digital. 10.5170/CERN-2008-003.131. [pdf]

HandWiki. Coherent sampling [link]

Luis Chioye, TI. Leverage coherent sampling and FFT windows when evaluating SAR ADCs (Part 1) [link]

Coherent Sampling vs. Window Sampling | Analog Devices https://www.analog.com/en/technical-articles/coherent-sampling-vs-window-sampling.html

Understanding Effective Number of Bits https://robustcircuitdesign.com/signal-chain-explorer/understanding-effective-number-of-bits/

ADC Input Noise: The Good, The Bad, and The Ugly. Is No Noise Good Noise? [https://www.analog.com/en/resources/analog-dialogue/articles/adc-input-noise.html]

Walt Kester, Taking the Mystery out of the Infamous Formula, "SNR = 6.02N + 1.76dB," and Why You Should Care [https://www.analog.com/media/en/training-seminars/tutorials/MT-001.pdf]

Dan Boschen, "How to choose FFT depth for ADC performance analysis (SINAD, ENOB)", [https://dsp.stackexchange.com/a/38201]