Data Converter

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Mid-Rise & Mid-Tread Quantizer

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The difference between the lowest and highest levels is called the full-scale (FS) of the quantizer

Bootstrapped Switch

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A. Abo et al., "A 1.5-V, 10-bit, 14.3-MS/s CMOS Pipeline Analog-to Digital Converter," IEEE J. Solid-State Circuits, pp. 599, May 1999 [https://sci-hub.se/10.1109/4.760369]

Dessouky and Kaiser, "Input switch configuration suitable for rail-to-rail operation of switched opamp circuits," Electronics Letters, Jan. 1999. [https://sci-hub.se/10.1049/EL:19990028]

B. Razavi, "The Design of a bootstrapped Sampling Circuit [The Analog Mind]," IEEE Solid-State Circuits Magazine, Volume. 13, Issue. 1, pp. 7-12, Summer 2021. [https://www.seas.ucla.edu/brweb/papers/Journals/BRSummer15Switch.pdf]

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Quantization Noise & its Spectrum

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Quantization noise is less with higher resolution as the input range is divided into a greater number of smaller ranges

This error can be considered a quantization noise with RMS

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ENOB & SQNR

The quantization noise power \(P_Q\) for a uniform quantizer with step size \(\Delta\) is given by \[ P_Q = \frac{\Delta ^2}{12} \] For a full-scale sinusoidal input signal with an amplitude equal to \(V_{FS}/2\), the input signal is given by \(x(t) = \frac{V_{FS}}{2}\sin(\omega t)\)

Then input signal power \(P_s\) is \[ P_s = \frac{V_{FS}^2}{8} \] Therefore, the signal-to-quantization noise ratio (SQNR) is given by \[ \text{SQNR} = \frac{P_s}{P_Q} = \frac{V_{FS}^2/8}{\Delta^2/12}=\frac{V_{FS}^2/8}{V_{FS}^2/(12\times 2^{2N})} = \frac{3\times 2^{2N}}{2} \] where \(N\) is the number of quantization bits

When represented in dBs \[ \text{SQNR(dB)} = 10\log(\frac{P_s}{P_Q}) = 10\log(\frac{3\times 2^{2N}}{2})= 20N\log(2) + 10\log(\frac{3}{2})= 6.02N + 1.76 \]

Quantization is NOT Noise

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ADC INL Testing

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ADC DNL Testing

DAC DNL Testing

One difference between ADC and DAC is that DAC DNL can be less than -1 LSB

In a DAC, DNL < -1LSB implies non-monotinicity

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Bottom plate sampling

Sample signal at the "grounded" side of the capacitor to achieve signal independent sampling

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[https://indico.cern.ch/event/1064521/contributions/4475393/attachments/2355793/4078773/esi_sampling_and_converters2022.pdf]

EE 435 Spring 2024 Analog VLSI Circuit Design - Switched-Capacitor Amplifiers Other Integrated Filters, https://class.ece.iastate.edu/ee435/lectures/EE%20435%20Lect%2044%20Spring%202008.pdf

Hold Mode Feedthrough

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P. Schvan et al., "A 24GS/s 6b ADC in 90nm CMOS," 2008 IEEE International Solid-State Circuits Conference - Digest of Technical Papers, San Francisco, CA, USA, 2008, pp. 544-634

B. Sedighi, A. T. Huynh and E. Skafidas, "A CMOS track-and-hold circuit with beyond 30 GHz input bandwidth," 2012 19th IEEE International Conference on Electronics, Circuits, and Systems (ICECS 2012), Seville, Spain, 2012, pp. 113-116

Tania Khanna, ESE 568: Mixed Signal Circuit Design and Modeling [https://www.seas.upenn.edu/~ese5680/fall2019/handouts/lec11.pdf]

CDAC intuition

The charge redistribution capacitor network is used to sample the input signal and serves as a digital-to-analog converter (DAC) for creating and subtracting reference voltages

sampling charge \[ Q = V_{in} C_{tot} \] conversion charge \[ Q = -C_{tot}V_c + V_{ref}C_\Delta \] That is \[ V_c = \frac{C_\Delta}{C_{tot}}V_{ref} - V_{in} \]

CDAC is actually working as a capacitive divider during conversion phase, the charge of internal node retain (charge conservation law)

assuming \(\Delta V_i\) is applied to series capacitor \(C_1\) and \(C_2\)

cap_divider.drawio \[ (\Delta V_i - \Delta V_x) C_1 = \Delta V_x \cdot C_2 \] Then \[ \Delta V_x = \frac{C_1}{C_1+C_2}\Delta V_i \]

\(V_x= V_{x,0} + \Delta V_x\)

CDAC settling time

cdac-tau.drawio \[\begin{align} V_x(s) &= \frac{C_1+C_2}{RC_1C_2}\cdot \frac{1}{s+\frac{C_1+C_2}{RC_1C_2}}\cdot V_i(s) \\ &= \frac{1}{\tau}\cdot \frac{1}{s+\frac{1}{\tau}}\cdot \frac{1}{s}\\ &= \frac{1}{\tau}\cdot \tau(\frac{1}{s} - \frac{1}{s+\frac{1}{\tau}})=\frac{1}{s} - \frac{1}{s+\frac{1}{\tau}} \end{align}\]

inverse Laplace Transform is \(V_x(t) = 1 - e^{-t/\tau}\)

\[\begin{align} V_y(s) &= V_x\frac{C_1}{C_1+C_2} \\ &= \frac{C_1}{C_1+C_2} \left(\frac{1}{s} - \frac{1}{s+\frac{1}{\tau}}\right)\\ \end{align}\]

inverse Laplace Transform is \(V_y(t) = \frac{C_1}{C_1+C_2}\left(1 - e^{-t/\tau}\right)\)

\(V_x(t)\) and \(V_y(t)\) prove that the settling time is same

\(\tau = R\frac{C_1C_2}{C_1+C_2}\), which means usually worst for MSB capacitor (largest)

CDAC Energy Consumption

\[ E_{Vref} = \int P(t)dt = \int V_{ref} I(t) dt = V_{ref}\int I(t)dt = V_{ref}\cdot \Delta Q \]

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Given \(V_{c,0}=\frac{1}{2}V_{ref}-V_{in}\) and \(V_{c,1}=\frac{3}{4}V_{ref}-V_{in}\) \[\begin{align} Q_{b0,0} &= \left(V_{ref} - V_{c,0} \right)\cdot 2C = \left(\frac{1}{2}V_{ref}+V_{in} \right)\cdot 2C \\ Q_{b1,0} &= (0 - V_{c,0})\cdot C = \left(-\frac{1}{2}V_{ref}+V_{in} \right)\cdot C \\ Q_{b0,1} &= \left(V_{ref} - V_{c,1} \right)\cdot 2C = \left(\frac{1}{4}V_{ref}+V_{in} \right)\cdot 2C \\ Q_{b1,1} &= \left(V_{ref} - V_{c,1} \right)\cdot C = \left(\frac{1}{4}V_{ref}+V_{in} \right)\cdot C \end{align}\]

Therefore \[ E_{Vref} = V_{ref}\cdot (Q_{b0,1}+Q_{b1,1} - Q_{b0,0}-Q_{b1,0}) = \frac{1}{4}C V_{ref}^2 \]

CDAC total energy change \[\begin{align} \Delta E_{tot} &= \frac{1}{2}\cdot 2C \cdot (U_{2c,1}^2 - U_{2c,0}^2) + \frac{1}{2}\cdot C \cdot (U_{c,1}^2 - U_{c,0}^2) + \frac{1}{2}\cdot C \cdot (U_{c1,1}^2 - U_{c1,0}^2) \\ &= \left(-\frac{3}{16}V_{ref}^2 - \frac{1}{2}V_{ref}V_{in} - \frac{3}{32}V_{ref}^2+\frac{3}{4}V_{ref}V_{vin} + \frac{5}{32}V_{ref}^2-\frac{1}{4}V_{ref}V_{in}\right)C \\ &= -\frac{1}{8}CV_{ref}^2 \end{align}\]

alternative method

CapEnergy.drawio \[ \Delta E_{tot} = \frac{1}{2}\cdot\frac{3}{4}C\cdot V_{ref}^2 - \frac{1}{2}\cdot C\cdot V_{ref}^2 = -\frac{1}{8}CV_{ref}^2 \]

The total energy decreases by \(-\frac{1}{8}CV_{ref}^2\), though \(V_{ref}\) provides \(\frac{1}{4}C V_{ref}^2\)

The charge redistribution change the CDAC energy

cap_redis_energy.drawio

\[ E_{c,0} = \frac{1}{2}CV^2 \] After charge redistribution \[ E_{c,1} = \frac{1}{2}\cdot 2C\cdot \left(\frac{1}{2}V\right)^2 = \frac{1}{4}CV^2 \]

That make sense, charge redistribution consume energy

Comparator input cap effect

image-20240907194621524 \[ -V_{in}\cdot 2^N C = V_c (2^N C + C_p) \] Then \(V_c = -\frac{2^N C}{2^N C + C_p}V_{in}\), i.e. this capacitance reduce the voltage amplitude by the factor

During conversion \[\begin{align} V_c &= -\frac{2^N C}{2^N C + C_p}V_{in} +V_{ref}\sum_{n=0}^{N-1} \frac{b_n\cdot2^n C}{2^N C + C_p} \\ &= \frac{2^N C}{2^N C + C_p}\left(-V_{in} + V_{ref}\sum_{n=0}^{N-1}\frac{b_n }{2^{N-n}} \right) \end{align}\]

That is, it does not change the sign

Comparator offset effect

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Summing Interleaved Alias

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The sampling function - impulse train is \[ s(t) = \sum_{n=-\infty}^{\infty}\left[ \delta(t-n4T_s) + \delta(t-n4T_s-T_s) + \delta(t-n4T_s-2T_s) + \delta(t-n4T_s-3T_s)\right] \]

Its Fourier transform is \[\begin{align} S(f) &= \frac{2\pi}{4T}\sum_{k=-\infty}^{\infty}\left[\delta(f-k\frac{f_s}{4}) + e^{-j2\pi f\cdot T_s}\delta(f-k\frac{f_s}{4}) + e^{-j2\pi f\cdot 2T_s}\delta(f-k\frac{f_s}{4}) + e^{-j2\pi f\cdot 3T_s}\delta(f-k\frac{f_s}{4}) \right] \\ &= \frac{2\pi}{4T}\sum_{k=-\infty}^{\infty}\left(1+e^{-j2\pi\frac{f}{f_s}} + e^{-j4\pi\frac{f}{f_s}} + e^{-j6\pi\frac{f}{f_s}} \right) \delta(f-k\frac{f_s}{4}) \\ &= \frac{2\pi}{4T}\sum_{k=-\infty}^{\infty}\left(1+e^{-jk\frac{\pi}{2}} + e^{-jk\pi} + e^{-jk\frac{3\pi}{2}} \right) \delta(f-k\frac{f_s}{4}) \end{align}\]

We define \(M[k] = 1+e^{-jk\frac{\pi}{2}} + e^{-jk\pi} + e^{-jk\frac{3\pi}{2}}\), which is periodic, i.e. \(M[k]=M[k+4]\) \[ M[k]=\left\{ \begin{array}{cl} 4 & : \ k = 4m \\ 0 & : \ k=4m+1 \\ 0 & : \ k=4m+2 \\ 0 & : \ k=4m+3 \\ \end{array} \right. \]

That is \[ S(f) = \frac{2\pi}{T}\sum_{k=-\infty}^{\infty} \delta(f-kf_s) \]

Alias has same frequency for each slice but different phase: Alias terms sum to zero if all slices match exactly

John P. Keane, ISSCC2020, T5: "Fundamentals of Time-Interleaved ADCs"

Random Chopping in TI-ADC

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\[ D_n(kT) = (G_n R(kT) V(kT) + O_n)R(kT)= C_n V(kT) + R(kT)O_n \]

reference

Aaron Buchwald, ISSCC2010 T1: "Specifying & Testing ADCs" [https://www.nishanchettri.com/isscc-slides/2010%20ISSCC/Tutorials/T1.pdf]

John P. Keane, ISSCC2020, T5: "Fundamentals of Time-Interleaved ADCs" [https://www.nishanchettri.com/isscc-slides/2020%20ISSCC/TUTORIALS/T5Visuals.pdf]

everynanocounts. Memos on FFT With Windowing. URL: https://a2d2ic.wordpress.com/2018/02/01/memos-on-fft-with-windowing/

How to choose FFT depth for ADC performance analysis (SINAD, ENOB). URL:https://dsp.stackexchange.com/a/38201

Computation of Effective Number of Bits, Signal to Noise Ratio, & Signal to Noise & Distortion Ratio Using FFT. URL:https://cdn.teledynelecroy.com/files/appnotes/computation_of_effective_no_bits.pdf

Kester, Walt. (2009). Understand SINAD, ENOB, SNR, THD, THD + N, and SFDR so You Don't Get Lost in the Noise Floor. URL:https://www.analog.com/media/en/training-seminars/tutorials/MT-003.pdf

T. C. Hofner: Dynamic ADC testing part I. Defining and testing dynamic ADC parameters, Microwaves & RF, 2000, vol. 39, no. 11, pp. 75-84,162

T. C. Hofner: Dynamic ADC testing part 2. Measuring and evaluating dynamic line parameters, Microwaves & RF, 2000, vol. 39, no. 13, pp. 78-94

AN9675: A Tutorial in Coherent and Windowed Sampling with A/D Converters https://www.renesas.com/us/en/document/apn/an9675-tutorial-coherent-and-windowed-sampling-ad-converters

APPLICATION NOTE 3190: Coherent Sampling Calculator (CSC) https://www.stg-maximintegrated.com/en/design/technical-documents/app-notes/3/3190.html

Coherent Sampling (Very Brief and Simple) https://www.dsprelated.com/thread/469/coherent-sampling-very-brief-and-simple

Signal Chain Basics #160: Making sense of coherent and noncoherent sampling in data-converter testing https://www.planetanalog.com/signal-chain-basics-160-making-sense-of-coherent-and-noncoherent-sampling-in-data-converter-testing/

Signal Chain Basics #104: Understanding noise in ADCs https://www.planetanalog.com/signal-chain-basics-part-104-understanding-noise-in-adcs/

Signal Chain Basics #101: ENOB Degradation Analysis Over Frequency Due to Jitter https://www.planetanalog.com/signal-chain-basics-part-101-enob-degradation-analysis-over-frequency-due-to-jitter/

Clock jitter analyzed in the time domain, Part 1, Texas Instruments Analog Applications Journal (slyt379), Aug 2010 https://www.ti.com/lit/an/slyt379/slyt379.pdf

Clock jitter analyzed in the time domain, Part 2 https://www.ti.com/lit/slyt389

Measurement of Total Harmonic Distortion and Its Related Parameters using Multi-Instrument [pdf]

Application Note AN-4: Understanding Data Converters' Frequency Domain Specifications [pdf]

Belleman, J. (2008). From analog to digital. 10.5170/CERN-2008-003.131. [pdf]

HandWiki. Coherent sampling [link]

Luis Chioye, TI. Leverage coherent sampling and FFT windows when evaluating SAR ADCs (Part 1) [link]

Coherent Sampling vs. Window Sampling | Analog Devices https://www.analog.com/en/technical-articles/coherent-sampling-vs-window-sampling.html

Understanding Effective Number of Bits https://robustcircuitdesign.com/signal-chain-explorer/understanding-effective-number-of-bits/

ADC Input Noise: The Good, The Bad, and The Ugly. Is No Noise Good Noise? [https://www.analog.com/en/resources/analog-dialogue/articles/adc-input-noise.html]

Walt Kester, Taking the Mystery out of the Infamous Formula, "SNR = 6.02N + 1.76dB," and Why You Should Care [https://www.analog.com/media/en/training-seminars/tutorials/MT-001.pdf]

Dan Boschen, "How to choose FFT depth for ADC performance analysis (SINAD, ENOB)", [https://dsp.stackexchange.com/a/38201]

Ahmed M. A. Ali 2016, "High Speed Data Converters" [pdf]